Speaker Notes
Oak Ridge National Laboratory
1. Aberration Corrected STEM Microscopy
Dr. Jaap Brink
JEOL USA, Inc.
1. Advances and Challenges in Electron Tomography
Dr. Paulo Ferreira
The University of Texas at Austin
1. In-situ TEM: Basics and Equipment Requirements
2. In-situ TEM: Applications (heating, deformation, gas reactions, wet-cell)
Dr. Alfredo Gomez
Universidad Nacional Autonoma de Mexico, Mexico
1. Simulation of images and diffraction patterns for HRTEM and STEM using the multislice method
- Lecture I (pdf)
- Lecture II (pdf)
Dr. Kazuo Ishizuka
HREM Research Inc. Japan
1. Exit wave reconstruction - software Cs correction
- Powerpoint Presentation (pdf)
2. Data processing in Electron Microscopy - Deconvolution and
Strain analysis.
- Powerpoint Presentation (pdf)
Dr. Sergio Mejia
Universidad Autónoma de Nuevo Leon, Mexico
1. Computation methods for HREM and STEM
Arizona State University
1. HRTEM of defects and interfaces in solids.
2. Electron holography in the TEM: Measuring charges and fields with sub-nanometer resolution.
3. Cathodoluminescence studies: combined imaging, spectroscopy, and time-resolved spectroscopy, with high spatial resolution.
- Lecture I - Part A (pdf)
- Lecture I - Part B (pdf)
- Lecture II (pdf)
Dr. Jose Reyes
Instituto de Fisica - Universidad Nacional Autonoma de Mexico
1. Electron diffraction characterization of materials
- Powerpoint Presentation (pdf)
The University of Texas at Austin
1. Low temperature scanning tunneling microscopy and spectroscopy of quantum engineered metallic thin films
The University of Texas at Austin
1. Molecular Imaging of Carcinogenesis with Plasmonic Nanosensors
Georgia Institute of Technology
1. In-situ mechanical and electrical measurements in TEM
2. Polar surface induced growth of novel oxide nanostructures
3. Nanogenerators and nanopiezotronics
Dr. de Lozanne
The University of Texas at Austin