Instrumentation


JEOL ARM 200F
JEOL ARM 200F
  • Atomic resolution microscope with aberration corrected probe
  • CEOS Hexapole Cs corrector capable of reaching a spatial resolution of 0.78 Å in STEM mode
  • Electron holography, Lorentz microscopy, and STEM-diffraction available
  • Dual-lens flexibility allows low and high magnifications with precise control of voltage to the objective lens (0-7V)
  • In situ capabilities: electrical-optical, mechanics, hall effect sensor, cryo, and tomography

 

ZEISS FIB-SEM Crossbeam
ZEISS FIB-SEM Crossbeam
  • Multi-detector acquisition system with SEM resolution (1.9nm @1 kV; 0.9 nm @30 kV –STEM mode) under analytical conditions
  • Ability to mill and image simultaneously

 

JEOL 2010F
JEOL 2010F
  • Field emission transmission electron microscope with a high-resolution pole piece 1.9 A
  • Diffraction contrast (BF and DF)
  • Phase contrast (HRTEM)
  • Selected area electron diffraction and convergent electron beam diffraction available

 

Hitachi SEM1510
Hitachi SEM1510
  • Scanning electron microscope
  • Variable pressure
  • EDS solid state detector

 

JEOL 1230 TEM
JEOL 1230 TEM
  • Transmission electron microscope
  • Energies 80 and 100 kV

 

Optical Zeiss Stereoscopes
Optical Zeiss Stereoscopes
  • CCD camera

 

Veeco Innova and Multimode AFM
Veeco Innova and Multimode AFM
  • Scanning probe system
  • Tapping and contact modes
  • AFM, MFM, EFM, CAFM, EC-STM, and nanoindentation modules

 

Hitachi STEM-5500
Hitachi STEM-5500
  • Scanning electron microscope equipped with STEM bright field and dark field detectors
  • Field-emission gun with a 0.4 nm of spatial resolution operated at 30 kV
  • Spatially resolved chemical analysis by X-ray emission spectroscopy equipped with a solid-state Bruker detector
  • Elemental line scanning and 2D mapping available
  • Automated YAG backscattered electron detector

 

Panalytical XRD
Panalytical XRD
  • Multi-purpose vertical diffractometer (θ-θ) with Cu Kα radiation and a high-resolution goniometer with a step size 0.0001º and 2θ linearity ± 0.01º over entire angular range
  • Diffractometer equipped with two detectors:
    • standard proportional detector
    • PIXcel3D detector
  • Anton-Paar DHS 1100 domed heated stage

 

Horiba Raman Spectrometer
Horiba Raman Spectrometer
  • Two different laser beams (red and blue wavelength)

 

Rigaku Ultima IV
Rigaku Ultima IV X-ray Diffraction
  • Parallel beam and focused beam
  • Small angle and thin films attachment

 

User Support Services

Our core provides the following services:

  • Flexible access to instrumentation in order to meet researcher’s needs for both small and large research projects
  • Education and training in transmission and scanning electron microscopy for all faculty, staff and students
  • Superior resolution and high quality results