Kleberg Advanced Microscopy Center


About the Core

The Kleberg Advanced Microscopy Center (KAMC) houses state-of-the-art instruments in electron microscopy and other advanced characterization equipment. The center supports world-class research in nanotechnology, biology, chemistry, and materials sciences. Our facility includes an aberration-corrected microscope in the STEM mode JEOL ARM 200F with a spatial resolution of 78 picometers. High-resolution electron microscopes such as a field emission gun JEOL 2010F and a STEM Hitachi S5500 as well as probe microscopes and X-ray diffraction. The Center is focused on high-resolution imaging, electron diffraction, electron holography, electron tomography, and EELS. In addition, the center has capabilities for in situ electron microscopy including nanomechanical, electrical, and optical measurements.

Core Instruments

  • JEOL 2010F TEM
  • JEOL 1230 TEM
  • Hitachi S5500 SEM/STEM
  • Hitachi SU1510 VP-SEM
  • Zeiss Crossbeam 340 FIB-SEM
  • Horiba Raman Microspectrometer
  • Veeco Nanoscope Multimode V AFM
  • Veeco Innova AFM
  • Rigaku Ultima IV XRD
  • Panalytical Empyrean XRD Diffractometer

Equipment capabilities can be found here.

Past support for the Kleberg Advanced Microscopy Center was in part provided by Research Centers in Minority Institutions (RCMI) Program within the "Nanotechnology and Human Health Core."

Fees Schedule

Fess are subject to revision without notice. Additional information about instrument fees can be found here.


Kleberg Advanced Microscopy Center
Department of Physics and Astronomy
The University of Texas at San Antonio
One UTSA Circle
San Antonio, Texas, 78249

Hours of Operation

8:00 am - 5:00 pm

Leadership and Contacts

Dr. Kelly Nash
Kelly Nash, Ph.D.
Core Director
(Contracts & Billing)

AET 3.203
(210) 458-6153

Dr. Ana Stevanovic
Ana Stevanovic, Ph.D.
Core Associate Director
(Core Facility Management,
Training & Technical Guidance)

AET 3.218
(210) 458-8735

no photo
Jason Guiliani
Instrument Support
(XRDs, AFMS, Raman)

AET 3.228
(210) 458-2017

no photo
Julian Villarreal, Ph.D.
Instrument Support
(EMs, XRDs, AFM)

AET 3.228
(210) 458-2017

Training Policies

  1. All users must undergo training on the use of instrumentation prior to having access to the facility. The amount of training will vary depending upon user experience.
  2. The core also offers personal in-depth training in methods of image processing and analysis using data acquired by the user. While this level of training is not required in order to obtain independent access to instrumentation, it is highly recommended.
  3. Upon the completion of training, an internal user will be granted access to the main entrance door and to each room housing the instrumentation for which the user is trained to use independently.
  4. Under no circumstances should an authorized user lend their ID card to another individual or swipe their ID card in order to grant the unauthorized user access to the imaging center. Any unauthorized access to instrumentation will result in the suspension of all user privileges.
  5. All work areas should be left clean, regardless if another user is to come on the system following your reserved time slot.
  6. Data is NOT indefinitely stored on the local acquisition computer. It is uploaded regularly to our dedicated server and removed from the microscope computer. Data management is a component of user training.

Core Acknowledgment Policies

If you used the equipment within KAMC to generate data for your manuscript, please use the following examples to help format your acknowledgment.

  • "The authors acknowledge the University of Texas at San Antonio Kleberg Advanced Microscopy Center for support during this work."
  • "The authors would like to thank Dr. FirstName LastName (Kleberg Advanced Microscopy Center, University of Texas at San Antonio) for technical support."