Arturo Ponce-Pedraza, Ph.D.
Office: AET 3.352
Phone: (210) 458-8267
Areas of Specialization
» Advanced electron microscopy
» Crystalline interfaces
» Semiconductor materials
Ph.D. in Industrial Processes Engineering; Universidad de Cadiz
M.S. in Semiconducting Materials; Universidad Autonoma de Puebla
My research is focused on the study of crystalline structure and interfaces of functional materials such as semiconductors and nanoparticles through advanced transmission electron microscopy. The development of new techniques to extract quantitative information at atomic scale involves aberration-corrected electron microscopy, electron diffraction, electron holography and Cryo-Tomography. As well as, in situ TEM experiments are part of my core research using special TEM holders for mechanical, electrical and optical characterization.
In addition, my work extends to the formalism of crystalline interfaces and the fundamental aspects between the physical space containing an interface and its atomic displacements. Those interfaces can be studied experimentally by atomic-resolution imaging, electron diffraction and theoretical approaches.
Click here for a list of publications.