Instrumentation
JEOL ARM 200F
- Atomic resolution microscope with aberration corrected probe
- CEOS Hexapole Cs corrector capable of reaching a spatial resolution of 0.78 Å in STEM mode
- Electron holography, Lorentz microscopy, and STEM-diffraction available
- Dual-lens flexibility allows low and high magnifications with precise control of voltage to the objective lens (0-7V)
- In situ capabilities: electrical-optical, mechanics, hall effect sensor, cryo, and tomography
ZEISS FIB-SEM Crossbeam
- Multi-detector acquisition system with SEM resolution (1.9nm @1 kV; 0.9 nm @30 kV –STEM mode) under analytical conditions
- Ability to mill and image simultaneously
JEOL 2010F
- Field emission transmission electron microscope with a high-resolution pole piece 1.9 A
- Diffraction contrast (BF and DF)
- Phase contrast (HRTEM)
- Selected area electron diffraction and convergent electron beam diffraction available
Hitachi SEM1510
- Scanning electron microscope
- Variable pressure
- EDS solid state detector
JEOL 1230 TEM
- Transmission electron microscope
- Energies 80 and 100 kV
Optical Zeiss Stereoscopes
- CCD camera
Veeco Innova and Multimode AFM
- Scanning probe system
- Tapping and contact modes
- AFM, MFM, EFM, CAFM, EC-STM, and nanoindentation modules
Hitachi STEM-5500
- Scanning electron microscope equipped with STEM bright field and dark field detectors
- Field-emission gun with a 0.4 nm of spatial resolution operated at 30 kV
- Spatially resolved chemical analysis by X-ray emission spectroscopy equipped with a solid-state Bruker detector
- Elemental line scanning and 2D mapping available
- Automated YAG backscattered electron detector
Panalytical XRD
- Multi-purpose vertical diffractometer (θ-θ) with Cu Kα radiation and a high-resolution goniometer with a step size 0.0001º and 2θ linearity ± 0.01º over entire angular range
- Diffractometer equipped with two detectors:
- standard proportional detector
- PIXcel3D detector
- Anton-Paar DHS 1100 domed heated stage
Horiba Raman Spectrometer
- Two different laser beams (red and blue wavelength)
Rigaku Ultima IV X-ray Diffraction
- Parallel beam and focused beam
- Small angle and thin films attachment
User Support Services
Our core provides the following services:
- Flexible access to instrumentation in order to meet researcher's needs for both small and large research projects
- Education and training in transmission and scanning electron microscopy for all faculty, staff and students
- Superior resolution and high quality results
